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JEDEC JESD28-1 PDF
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N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
| Published by | Publication Date | Number of Pages |
| JEDEC | 09/01/2001 | 14 |
JEDEC JESD28-1 – N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
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