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JEDEC JESD 435 (R2009) PDF
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STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
| Published by | Publication Date | Number of Pages |
| JEDEC | 04/01/1976 | 23 |
JEDEC JESD 435 (R2009) – STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
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