IEC 60749-32 Ed. 1.1 b PDF

Semiconductor devices – Mechanical and climatic test methods – Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION

IEC 60749-32 Ed. 1.1 b – Semiconductor devices – Mechanical and climatic test methods – Part 32: Flammability of plastic-encapsulated devices (externally induced) CONSOLIDATED EDITION

IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating.The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.This consolidated version consists of the first edition (2002)and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.