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JIS C 5402-6-2 PDF
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Connectors for electronic equipment — Tests and measurements — Part 6-2: Dynamic stress tests — Test 6b: Bump
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-6-2 – Connectors for electronic equipment — Tests and measurements — Part 6-2: Dynamic stress tests — Test 6b: Bump
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