Your shopping cart is empty!
IEC 60749-17 Ed. 2.0 b PDF
Product Code:
Availability:
Availability:
product
In Stock
In Stock
$28.05
$51.00
IN TAX $28.05
IN TAX $28.05
Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
| Published by | Publication Date | Number of Pages |
| IEC | 03/28/2019 | 17 |
Preview
IEC 60749-17 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Worldwide Standards PDF © 2024
Reviews (0)