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IEC 60749-43 Ed. 1.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
| Published by | Publication Date | Number of Pages |
| IEC | 06/15/2017 | 74 |
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IEC 60749-43 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
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