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IEC 62969-4 Ed. 1.0 b PDF
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Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors
| Published by | Publication Date | Number of Pages |
| IEC | 06/18/2018 | 39 |
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IEC 62969-4 Ed. 1.0 b – Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
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