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IEC 61445 Ed. 1.0 en PDF
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Digital Test Interchange Format (DTIF)
| Published by | Publication Date | Number of Pages |
| IEC | 06/21/2012 | 101 |
IEC 61445 Ed. 1.0 en – Digital Test Interchange Format (DTIF)
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
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