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IEC 60749-8 Ed. 1.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 8: Sealing
| Published by | Publication Date | Number of Pages |
| IEC | 08/30/2002 | 31 |
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IEC 60749-8 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 8: Sealing
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
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