Your shopping cart is empty!
IEC 60749-36 Ed. 1.0 b PDF
Product Code:
Availability:
Availability:
product
In Stock
In Stock
$22.00
$40.00
IN TAX $22.00
IN TAX $22.00
Semiconductor devices – Mechanical and climatic test methods – Part 36: Acceleration, steady state
| Published by | Publication Date | Number of Pages |
| IEC | 02/13/2003 | 7 |
Preview
IEC 60749-36 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Worldwide Standards PDF © 2024
Reviews (0)