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IEC 60749-1 Ed. 1.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 1: General
| Published by | Publication Date | Number of Pages |
| IEC | 08/30/2002 | 15 |
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IEC 60749-1 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
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