IEC 60444-2 Ed. 1.0 b PDF
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Published by | Publication Date | Number of Pages |
IEC | 01/01/1980 | 18 |
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IEC 60444-2 Ed. 1.0 b – Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
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