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ASTM F1893 PDF
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Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
| Published by | Publication Date | Number of Pages |
| ASTM | 03/01/2018 | 7 |
ASTM F1893 – Guide forMeasurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
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