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ASTM F1190 PDF
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Standard Guide for Neutron Irradiation of Unbiased Electronic Components
| Published by | Publication Date | Number of Pages |
| ASTM | 03/01/2018 | 6 |
ASTM F1190 – Standard Guide forNeutron Irradiation of Unbiased Electronic Components
1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation to determine the permanent damage in the components. Validated 1-MeV displacement damage functions codified in National Standards are not currently available for other semiconductor materials.
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