Your shopping cart is empty!
JIS K 0148 PDF
Product Code:
Availability:
Availability:
product
In Stock
In Stock
$37.40
$68.00
IN TAX $37.40
IN TAX $37.40
Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS K 0148 – Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Reviews (0)