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JEDEC JESD6 (R2002) PDF
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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
| Published by | Publication Date | Number of Pages |
| JEDEC | 02/01/1967 | 17 |
JEDEC JESD6 (R2002) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
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