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JEDEC JESD47K PDF
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STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
| Published by | Publication Date | Number of Pages |
| JEDEC | 08/01/2018 | 34 |
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JEDEC JESD47K – STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
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