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JEDEC JESD398 (R2009) PDF
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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
| Published by | Publication Date | Number of Pages |
| JEDEC | 07/01/1972 | 14 |
JEDEC JESD398 (R2009) – MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398
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