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JEDEC JESD226 PDF
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RF Biased Life (RFBL) Test Method
| Published by | Publication Date | Number of Pages |
| JEDEC | 01/01/2013 | 20 |
JEDEC JESD226 – RF Biased Life (RFBL) Test Method
This stress method is used to determine the effects of RF bias conditions and temperature on PowerAmplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operatingcondition in an accelerated way, and they are expected to be applied primarily for device qualification andreliability monitoring.
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