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JEDEC JESD 372 (R2009) PDF
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THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS
| Published by | Publication Date | Number of Pages |
| JEDEC | 05/01/1970 | 13 |
JEDEC JESD 372 (R2009) – THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.
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