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JEDEC JEP174 PDF
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UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
| Published by | Publication Date | Number of Pages |
| JEDEC | 09/01/2016 | 174 |
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JEDEC JEP174 – UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
The purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.
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