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IEC 60333 Ed. 3.0 b PDF
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Nuclear instrumentation – Semiconductor charged-particle detectors – Test procedures
| Published by | Publication Date | Number of Pages |
| IEC | 07/14/1993 | 76 |
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IEC 60333 Ed. 3.0 b – Nuclear instrumentation – Semiconductor charged-particle detectors – Test procedures
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
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