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IEEE P2665 PDF
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IEEE Draft Recommended Practice for Statistical Process Control for EMC Test Laboratories
| Published by | Publication Date | Number of Pages |
| IEEE | n/a | 41 |
IEEE P2665 – IEEE Draft Recommended Practice for Statistical Process Control for EMC Test Laboratories
New IEEE Standard – Active – Draft.This standard provides guidance on how to verify Electromagnetic Compatibility (EMC) test performance through the use of statistical process control (SPC) and specialized setups. By employing SPC a laboratory can monitor the validity of tests by recording data in such a way that trends are detectable and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence to both the laboratory and its customer that test results will be correct.
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