IEEE P1500 PDF
IEEE P1500 PDF
$83.60

IEEE P1500 PDF

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IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits

Published byPublication DateNumber of Pages
IEEE09/14/2022154

IEEE P1500 – IEEE Approved Draft Standard Testability Method for Embedded Core-based Integrated Circuits

Revision Standard – Active – Draft.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.

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