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IEEE C62.35 PDF
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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
| Published by | Publication Date | Number of Pages |
| IEEE | 08/31/2010 | 26 |
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IEEE C62.35 – IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
Revision Standard – Superseded.Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips.
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