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IEEE 1687 PDF
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IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
| Published by | Publication Date | Number of Pages |
| IEEE | 12/05/2014 | 266 |
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IEEE 1687 – IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
New IEEE Standard – Active.A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.
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