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IEEE 1500 PDF
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IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
| Published by | Publication Date | Number of Pages |
| IEEE | 08/29/2005 | 117 |
IEEE 1500 – IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
New IEEE Standard – Inactive-Reserved.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.
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