Your shopping cart is empty!
IEEE 759 PDF
Product Code:
Availability:
Availability:
product
In Stock
In Stock
$73.70
$134.00
IN TAX $73.70
IN TAX $73.70
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
| Published by | Publication Date | Number of Pages |
| IEEE | 12/15/1984 | 0 |
IEEE 759 – IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
New IEEE Standard – Inactive-Withdrawn.Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
Reviews (0)