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IEC 62373 Ed. 1.0 b PDF
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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
| Published by | Publication Date | Number of Pages |
| IEC | 07/18/2006 | 27 |
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IEC 62373 Ed. 1.0 b – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
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