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IEC 62899-503-3 Ed. 1.0 en PDF
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Printed electronics – Part 503-3: Quality assessment – Measuring method of contact resistance for the printed thin film transistor – Transfer length method
| Published by | Publication Date | Number of Pages |
| IEC | 08/01/2021 | 18 |
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IEC 62899-503-3 Ed. 1.0 en – Printed electronics – Part 503-3: Quality assessment – Measuring method of contact resistance for the printed thin film transistor – Transfer length method
This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.
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