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IEC 62899-402-1 Ed. 1.0 en PDF
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Printed electronics – Part 402-1: Printability – Measurement of qualities – Pattern width
| Published by | Publication Date | Number of Pages |
| IEC | 03/03/2017 | 12 |
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IEC 62899-402-1 Ed. 1.0 en – Printed electronics – Part 402-1: Printability – Measurement of qualities – Pattern width
IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
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