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IEC 62416 Ed. 1.0 b PDF
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Semiconductor devices – Hot carrier test on MOS transistors
| Published by | Publication Date | Number of Pages |
| IEC | 04/26/2010 | 20 |
IEC 62416 Ed. 1.0 b – Semiconductor devices – Hot carrier test on MOS transistors
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
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