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IEC 62047-40 Ed. 1.0 en PDF
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Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
| Published by | Publication Date | Number of Pages |
| IEC | 09/01/2021 | 16 |
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IEC 62047-40 Ed. 1.0 en – Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open microelectromechanical inertial shock switch.
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