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IEC 60749-35 Ed. 1.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 35: Acoustic microscopy for plastic encapsulated electronic components
| Published by | Publication Date | Number of Pages |
| IEC | 07/18/2006 | 43 |
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IEC 60749-35 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 35: Acoustic microscopy for plastic encapsulated electronic components
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
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