IEC 60749-27 Ed. 2.0 b PDF
IEC 60749-27 Ed. 2.0 b PDF
$48.95

IEC 60749-27 Ed. 2.0 b PDF

   0 reviews
Product Code:
Availability:
product
In Stock
$48.95 $89.00
IN TAX $48.95
Ask about this product

Semiconductor devices – Mechanical and climatic test methods – Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

Published byPublication DateNumber of Pages
IEC07/18/200625
Preview

IEC 60749-27 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

Reviews (0)

   0 reviews
Write a review