IEC 60749-15 Ed. 3.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 15: Resistance to soldering temperature for through-hole mounted devices
Published by | Publication Date | Number of Pages |
IEC | 07/14/2020 | 17 |
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IEC 60749-15 Ed. 3.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 15: Resistance to soldering temperature for through-hole mounted devices
IEC 60749-15:2020 describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of their leads by using wave soldering or a soldering iron.
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