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IEC 60749-13 Ed. 1.0 b PDF
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Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
| Published by | Publication Date | Number of Pages |
| IEC | 04/12/2002 | 9 |
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IEC 60749-13 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
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