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IEC 60512-25-3 Ed. 1.0 b PDF
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Connectors for electronic equipment – Tests and measurements – Part 25-3: Test 25c – Rise time degradation
| Published by | Publication Date | Number of Pages |
| IEC | 07/26/2001 | 23 |
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IEC 60512-25-3 Ed. 1.0 b – Connectors for electronic equipment – Tests and measurements – Part 25-3: Test 25c – Rise time degradation
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
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