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IEC 63284 Ed. 1.0 b PDF
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Semiconductor devices – Reliability test method by inductive load switching for gallium nitride transistors
| Published by | Publication Date | Number of Pages |
| IEC | 04/01/2022 | 30 |
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IEC 63284 Ed. 1.0 b – Semiconductor devices – Reliability test method by inductive load switching for gallium nitride transistors
This document covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress.
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