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IEC 62047-32 Ed. 1.0 b PDF
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Semiconductor devices – Micro-electromechanical devices – Part 32: Test method for the nonlinear vibration of MEMS resonators
| Published by | Publication Date | Number of Pages |
| IEC | 01/24/2019 | 37 |
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IEC 62047-32 Ed. 1.0 b – Semiconductor devices – Micro-electromechanical devices – Part 32: Test method for the nonlinear vibration of MEMS resonators
IEC 62047-32:2019 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators.
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