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ASTM F744M PDF
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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
| Published by | Publication Date | Number of Pages |
| ASTM | 05/01/2016 | 7 |
ASTM F744M – Standard Test Method forMeasuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
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